The TOFPAXRIXS instrument, recently commissioned on the P04 beamline at DESY, offers a compact design that uniquely combines Angle-Resolved Photoemission Spectroscopy (ARPES) with a Time-of-Flight (ToF) detector and Resonant Inelastic X-ray Scattering (RIXS) using the Photoelectron spectrometry for Analysis of X-rays (PAX) approach [1].

This enables direct correlation between electronic properties measured by ARPES and collective excitations probed by RIXS, an essential step toward understanding electronic order in quantum materials, including unconventional superconductors, antiferromagnets, and van der Waals heterostructures.

In this talk, I will briefly introduce the ToF-PAX-RIXS concept and show first results combining ARPES and RIXS on the same sample.

[1] G. L. Dakovski et al., J Synchrotron Rad. 24, 1180–1186 (2017).